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The papers listed below have been selected as "Best Papers" based on the reviews of the original submission, the camera-ready version, and the presentation during the conference. A diploma will be issued in the name of the authors and mailed to the contact author. Papers Reusing Component Test Cases for Integration Testing of Retarding Embedded System Components Scenario-Based Test Case Generation Using Event-B Models A High-Level Language and Compiler to Configure the Multi-core Debug Solution (MCDS) Integration Test Order Strategies to Consider Test Focus and Simulation Effort Using the Testability Analysis Methodology for the Validation of AIRBUS Systems FPGA-Accelerated Baseband Design and Verification of Broadband MIMO Wireless Systems Using TMR Architectures for SoC Yield Improvement |
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